Title :
Novel boundary scan circuit and methodology for ECL/BiCMOS VLSI
Author :
Shookhtim, Rimon ; Lee, Lo-Shan ; Mansoorian, Babak ; Rothenberger, Roland ; Pond, Gil
Author_Institution :
Unisys Corp., San Diego, CA, USA
Abstract :
The authors introduce a novel technique which combines specially designed ECL (emitter coupled logic) and CMOS circuitry to produce a BiCMOS boundary scan circuit suitable for high-performance BiCMOS and ECL VLSI chips. A circuit description is given, and attention is given to system operation and to observability and controllability aspects. The layout of the BiCMOS scan chain element is shown
Keywords :
BIMOS integrated circuits; VLSI; circuit layout; emitter-coupled logic; integrated logic circuits; BiCMOS scan chain element; ECL/BiCMOS VLSI; boundary scan circuit; controllability; design for testability; layout; logic diagram; observability; system operation; BiCMOS integrated circuits; CMOS logic circuits; CMOS technology; Circuit testing; Clocks; Flip-flops; Latches; Logic testing; System testing; Very large scale integration;
Conference_Titel :
Bipolar Circuits and Technology Meeting, 1990., Proceedings of the 1990
Conference_Location :
Minneapolis, MN
DOI :
10.1109/BIPOL.1990.171144
