• DocumentCode
    2703859
  • Title

    Failure mechanism of hole formation in laser welding technique for optoelectronic packaging

  • Author

    Cheng, W.H. ; Wang, W.H. ; Huang, Y.M. ; Chen, H.Y. ; Lin, H.H.

  • Author_Institution
    Inst. of Electro.-Opt. Eng., Nat. Sun Yat-Sen Univ., Kaohsiung, Taiwan
  • fYear
    1995
  • fDate
    21-24 May 1995
  • Firstpage
    914
  • Lastpage
    916
  • Abstract
    The characteristics of hole formation in the laser welding technique for optoelectronic packaging have been investigated by metallographic microscopes. The results show that the hole dimension depends on the power density of the laser beam and the hole disappears as the power density falls below 4×105 W/cm2. The hole generation between welded sections can cause spatial nonuniformity of solidification-shrinkage during the laser welding process, resulting in the generation of micromovement. Micromovement due to the failure mechanism of the hole formation during the laser welding process may affect the alignment for optoelectronic packages, particularly for single-mode fiber applications. Based on our understanding of laser welding process characteristics, a reliability study of receptacle laser packages is currently under investigation
  • Keywords
    failure analysis; laser beam welding; microscopy; optoelectronic devices; semiconductor device packaging; semiconductor device reliability; semiconductor lasers; alignment; failure mechanism; hole formation; laser beam power density; laser welding technique; metallographic microscopes; micromovement; optoelectronic packaging; receptacle laser packages; reliability study; single-mode fiber applications; solidification-shrinkage; spatial nonuniformity; Costs; Failure analysis; Fiber lasers; Laser beams; Optical fibers; Power lasers; Semiconductor device packaging; Semiconductor lasers; Solid lasers; Welding;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 1995. Proceedings., 45th
  • Conference_Location
    Las Vegas, NV
  • Print_ISBN
    0-7803-2736-5
  • Type

    conf

  • DOI
    10.1109/ECTC.1995.517798
  • Filename
    517798