Title :
Model-based calibration for sensor networks
Author :
Feng, J. ; Megerian, S. ; Potkonjak, M.
Author_Institution :
Dept. of Comput. Sci., California Univ., Los Angeles, CA, USA
Abstract :
Calibration is the process of mapping raw sensor readings into corrected values by identifying and correcting systematic bias. Calibration is important from both off-line and on-line perspectives. Major objectives of calibration procedure include accuracy, resiliency against random errors, ability to be applied in various scenarios, and to address a variety of error models. In addition, a compact mapping function is attractive in terms of both storage and robustness. We start by introducing the nonparametric statistical approach for conducting off-line calibration. After that, we present the non-parametric statistical percentile method for establishing the confidence interval for a particular mapping function. Furthermore, we propose the first model-based on-line procedure for calibration. The calibration problem is formulated as an instance of nonlinear function minimization and solved using the standard conjugate gradient approach. A number of trade-offs between the effectiveness of calibration and noise level, latency, size of network and the complexity of phenomena are analyzed in a quantitative way. As a demonstration example, we use a system consisting of photovoltaic optical sensors.
Keywords :
calibration; conjugate gradient methods; error statistics; optical sensors; wireless sensor networks; accuracy; compact mapping function; confidence interval; error models; latency; mapping function; mapping raw sensor readings; model-based calibration; model-based on-line procedure; noise level; nonlinear function minimization; nonparametric statistical percentile method; off-line calibration; photovoltaic optical sensors; resiliency against random errors; robustness; sensor networks; size of network; standard conjugate gradient approach; storage; systematic bias; Calibration; Computer errors; Computer science; Delay; Noise level; Optical sensors; Robustness; Sensor phenomena and characterization; Sensor systems; Wireless sensor networks;
Conference_Titel :
Sensors, 2003. Proceedings of IEEE
Print_ISBN :
0-7803-8133-5
DOI :
10.1109/ICSENS.2003.1279039