• DocumentCode
    2704077
  • Title

    The importance of molding compound chemical shrinkage in the stress and warpage analysis of PQFPs

  • Author

    Kelly, G. ; Lyden, C. ; Lawton, W. ; Barrett, J. ; Saboui, A. ; Pape, H. ; Peters, H.

  • Author_Institution
    Nat. Microelectron. Res. Centre, Univ. Coll. Cork, Ireland
  • fYear
    1995
  • fDate
    21-24 May 1995
  • Firstpage
    977
  • Lastpage
    981
  • Abstract
    This paper addresses the use of finite element techniques to predict residual warpage in PQFPs after encapsulation. Experimental measurements of package warpage are used to validate finite element models of the packages. Failure to incorporate mold compound chemical shrinkage into the FE analysis leads to erroneous predictions of package warpage. The warpage sensitivity of different packages to changes in downset is presented. The validated FE package models predict stress levels in packages which are 70% greater than those with TCE shrinkage alone and questions the accuracy of previously simulations which do not include molding compound chemical shrinkage
  • Keywords
    encapsulation; finite element analysis; integrated circuit packaging; plastic packaging; shrinkage; PQFPs; TCE shrinkage; chemical shrinkage; downset; encapsulation; finite element techniques; molding compound; residual warpage; stress levels; warpage analysis; Chemical analysis; Chemical compounds; Finite element methods; Integrated circuit modeling; Microelectronics; Packaging; Plastics; Predictive models; Temperature; Tensile stress;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 1995. Proceedings., 45th
  • Conference_Location
    Las Vegas, NV
  • Print_ISBN
    0-7803-2736-5
  • Type

    conf

  • DOI
    10.1109/ECTC.1995.517809
  • Filename
    517809