• DocumentCode
    270431
  • Title

    Analysis of Straight Periodic Segmented Waveguide Using the 2-D Finite Element Method

  • Author

    Rubio-Mercedes, C.E. ; Rodríguez-Esquerre, V.F. ; Lima, Ivan T. ; Hernández-Figueroa, Hugo E.

  • Author_Institution
    Math. & Eng. Phys. Programs, State Univ. of Mato Grosso do Sul, Dourados, Brazil
  • Volume
    32
  • Issue
    11
  • fYear
    2014
  • fDate
    1-Jun-14
  • Firstpage
    2163
  • Lastpage
    2169
  • Abstract
    A numerical analysis of periodic segmented waveguides (PSWs) using the 2-D finite element method (2D-FEM) in the frequency domain is presented. This method has significantly lower computational cost when compared with 3-D methods that have been used to model PSWs, and can also model back reflected signals. Unlike photonic crystal waveguides, light confinement in a PSW is due to total internal reflection as in a continuous waveguide (CWG). We show that the dispersion relation of the guided modes in PSW is strongly influenced by the dielectric periodicity along the waveguide. We calculate the mode profile of a PSW in a region far away from the bandgap and we showed that it is comparable to the mode profile of the equivalent CWG even for relatively high values of averaged refractive index contrast.
  • Keywords
    finite element analysis; light reflection; optical dispersion; optical waveguide theory; refractive index; 2D finite element method; 2D-FEM; back reflected signals; bandgap; dielectric periodicity; dispersion relation; frequency domain; guided modes; light confinement; mode profile; numerical analysis; refractive index contrast; straight periodic segmented waveguide; total internal reflection; Finite element analysis; Indexes; Optical waveguides; Refractive index; Silicon; Silicon compounds; Continuum waveguide; equivalent index; finite element methods; mode profile; segmented waveguide;
  • fLanguage
    English
  • Journal_Title
    Lightwave Technology, Journal of
  • Publisher
    ieee
  • ISSN
    0733-8724
  • Type

    jour

  • DOI
    10.1109/JLT.2014.2321047
  • Filename
    6807678