DocumentCode
2704351
Title
Palladium plating: A lead free finish for IC leadframes
Author
Abbott, Donald C. ; Romm, Douglas W.
Author_Institution
Attleboro Leadframe Div., Texas Instrum. Inc., Attleboro, MA, USA
fYear
1995
fDate
21-24 May 1995
Firstpage
1068
Lastpage
1072
Abstract
Concern has grown recently over the amount of lead (Pb) used in electronic products and manufacturing environments. In response, the electronics industry has begun investigating alternatives to traditional tin/lead (Sn/Pb) solders. Several consortia are working to determine the feasibility of Pb-free solder alloys. In 1989 Texas Instruments introduced a revolutionary new leadframe finish to the semiconductor industry. This technology consists of a copper base metal leadframe plated with nickel and palladium. The palladium acts as an oxidation barrier for the nickel which is the soldered surface. This palladium finished leadframe has replaced conventional Sn/Pb coating for greater than 99% of TI´s logic and linear devices. No Pb is used in the manufacture of the leadframe or in the assembly of the IC. Devices with TI´s palladium lead finish have been identified as a primary test vehicle for Pb-free solders. Components with TI´s Pd finish have no Sn/Pb on their surface to influence test results of Pb-free solders. Traditional Sn/Pb plated or dipped components can influence test results when evaluating Pb-free solders. When viable, Pb-free solders are identified and available, the next issue will be to remove Pb from the IC component. TI has more than 8 billion palladium plated devices in the field. TI´s Ni/Pd plating technology is a Pb-free alternative for IC manufacturers and users who desire to use Pb-free processes
Keywords
electrochemistry; electroplating; integrated circuit packaging; palladium; soldering; IC leadframes; Pd; Texas Instruments; lead free finish; linear devices; logic devices; manufacturing; oxidation barrier; palladium plating; solder alloys; Copper; Electronics industry; Environmentally friendly manufacturing techniques; Instruments; Lead compounds; Nickel; Palladium; Semiconductor device manufacture; Testing; Tin;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 1995. Proceedings., 45th
Conference_Location
Las Vegas, NV
Print_ISBN
0-7803-2736-5
Type
conf
DOI
10.1109/ECTC.1995.517823
Filename
517823
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