• DocumentCode
    2704351
  • Title

    Palladium plating: A lead free finish for IC leadframes

  • Author

    Abbott, Donald C. ; Romm, Douglas W.

  • Author_Institution
    Attleboro Leadframe Div., Texas Instrum. Inc., Attleboro, MA, USA
  • fYear
    1995
  • fDate
    21-24 May 1995
  • Firstpage
    1068
  • Lastpage
    1072
  • Abstract
    Concern has grown recently over the amount of lead (Pb) used in electronic products and manufacturing environments. In response, the electronics industry has begun investigating alternatives to traditional tin/lead (Sn/Pb) solders. Several consortia are working to determine the feasibility of Pb-free solder alloys. In 1989 Texas Instruments introduced a revolutionary new leadframe finish to the semiconductor industry. This technology consists of a copper base metal leadframe plated with nickel and palladium. The palladium acts as an oxidation barrier for the nickel which is the soldered surface. This palladium finished leadframe has replaced conventional Sn/Pb coating for greater than 99% of TI´s logic and linear devices. No Pb is used in the manufacture of the leadframe or in the assembly of the IC. Devices with TI´s palladium lead finish have been identified as a primary test vehicle for Pb-free solders. Components with TI´s Pd finish have no Sn/Pb on their surface to influence test results of Pb-free solders. Traditional Sn/Pb plated or dipped components can influence test results when evaluating Pb-free solders. When viable, Pb-free solders are identified and available, the next issue will be to remove Pb from the IC component. TI has more than 8 billion palladium plated devices in the field. TI´s Ni/Pd plating technology is a Pb-free alternative for IC manufacturers and users who desire to use Pb-free processes
  • Keywords
    electrochemistry; electroplating; integrated circuit packaging; palladium; soldering; IC leadframes; Pd; Texas Instruments; lead free finish; linear devices; logic devices; manufacturing; oxidation barrier; palladium plating; solder alloys; Copper; Electronics industry; Environmentally friendly manufacturing techniques; Instruments; Lead compounds; Nickel; Palladium; Semiconductor device manufacture; Testing; Tin;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 1995. Proceedings., 45th
  • Conference_Location
    Las Vegas, NV
  • Print_ISBN
    0-7803-2736-5
  • Type

    conf

  • DOI
    10.1109/ECTC.1995.517823
  • Filename
    517823