Title :
Color Image Observation Using Near-field Optical Microscope
Author :
Kiguchi, Masashi ; Kate, M. ; Ishibashi, Masayoshi
Author_Institution :
Advanced Research Laboratory, Hitachi, Ltd., Hatoyama, Saitarna 350-03, JAPAN
Keywords :
Atom optics; Atomic force microscopy; Color; Electron optics; Optical films; Optical microscopy; Probes; Scanning electron microscopy; Solids; Spectroscopy;
Conference_Titel :
Lasers and Electro-Optics, 1997. CLEO/Pacific Rim '97., Pacific Rim Conference on
Conference_Location :
Chiba, Japan
Print_ISBN :
0-7803-3889-8
DOI :
10.1109/CLEOPR.1997.610695