• DocumentCode
    2704542
  • Title

    Diagnostic test generation for transition faults using a stuck-at ATPG tool

  • Author

    Higami, Yoshinobu ; Kurose, Yosuke ; Ohno, Satoshi ; Yamaoka, Hironori ; Takahashi, Hiroshi ; Shimizu, Yoshihiro ; Aikyo, Takashi ; Takamatsu, Yuzo

  • Author_Institution
    Grad. Sch. of Sci. & Eng., Ehime Univ., Matsuyama, Japan
  • fYear
    2009
  • fDate
    1-6 Nov. 2009
  • Firstpage
    1
  • Lastpage
    9
  • Abstract
    This paper presents a diagnostic test generation method for transition faults. As two consecutive vectors application mechanism, launch on capture test is considered. The proposed algorithm generates test vectors for given fault pairs using a stuck-at ATPG tool so that they are distinguished. If a given fault pair is indistinguishable, it is identified. Therefore the proposed algorithm provides a complete test generation regarding the distinguishability. The conditions for distinguishing a fault pair are carefully considered, and they are transformed into the conditions of the detection of a stuck-at fault, and some additional logic are inserted in a CUT for the test generation. Experimental results show that the proposed method can generate test vectors for distinguishing the fault pairs that are not distinguished by commercial tools, and also identify all the indistinguishable fault pairs.
  • Keywords
    automatic test pattern generation; fault diagnosis; diagnostic test generation; stuck-at ATPG tool; transition faults; Automatic test pattern generation; Circuit faults; Circuit testing; Delay; Fault detection; Fault diagnosis; Large scale integration; Logic testing; Manufacturing processes; Semiconductor device testing; Fault diagnosis; Stuck-at ATPG; Test generation; Transition faults;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2009. ITC 2009. International
  • Conference_Location
    Austin, TX
  • Print_ISBN
    978-1-4244-4868-5
  • Electronic_ISBN
    978-1-4244-4867-8
  • Type

    conf

  • DOI
    10.1109/TEST.2009.5355681
  • Filename
    5355681