DocumentCode :
2704583
Title :
The influence of Conducting Rough Surfaces on the performance of microwave coaxial filter
Author :
Ning, Yuemin ; Jiang, Wanshun ; Deng, Jianqin
Author_Institution :
41st Inst., Nat. Key Lab. of Sci. & Technol. on Electron. Test & Meas., China Electron. Technol. Group Corp., Qingdao, China
fYear :
2009
fDate :
27-29 Oct. 2009
Firstpage :
778
Lastpage :
781
Abstract :
Conducting rough surfaces (CRS) of microwave devices introduced by the manufacturing process lead to a variation in the device performance. In course of debugging microwave and millimeter wave devices, we often need to get the accurate electromagnetic models for conducting rough surfaces. In this paper, the electromagnetic characteristics of two-dimensional conducting rough surfaces are studied at microwave frequencies. Machine-fabricated rough surfaces with controlled roughness statistics were examined accurately. The reflecting energy and the absorbing energy of electromagnetic waves are dependent on the surface roughness and the working frequency. Because microwave has a short wavelength, the characteristics of the reflecting and the absorbing energy of electromagnetic waves are affected by the surface roughness strongly. In this paper, the reflecting characteristics and the absorbing characteristics of a series of nickel, aluminous and gold rough surfaces are measured using the broadband integrative vector network analyzer VNA) from 3.95 GHz to 4.25 GHz. The reflecting coefficient and the absorbing characteristics of the rough surfaces are extracted by the measured data and the statistical analysis methods.
Keywords :
electromagnetic waves; gold; microwave filters; millimetre wave devices; network analysers; nickel; rough surfaces; statistical analysis; 2D conducting rough surfaces; aluminous rough surfaces; broadband integrative vector network analyzer; controlled roughness statistics; electromagnetic models; electromagnetic waves; frequency 3.95 GHz to 4.25 GHz; gold rough surfaces; microwave coaxial filter; microwave devices; millimeter wave devices; nickel rough surfaces; statistical analysis; Coaxial components; Debugging; Electromagnetic scattering; Manufacturing processes; Microwave devices; Microwave filters; Millimeter wave technology; Rough surfaces; Surface roughness; Surface waves; Conducting roug surfaces; coaxial filter;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave, Antenna, Propagation and EMC Technologies for Wireless Communications, 2009 3rd IEEE International Symposium on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-4076-4
Type :
conf
DOI :
10.1109/MAPE.2009.5355683
Filename :
5355683
Link To Document :
بازگشت