DocumentCode :
2704666
Title :
An industrial case study for X-canceling MISR
Author :
Yang, Joon-Sung ; Touba, Nur A. ; Yang, Shih-Yu ; Mak, T.M.
Author_Institution :
Comput. Eng. Res. Center, Univ. of Texas, Austin, TX, USA
fYear :
2009
fDate :
1-6 Nov. 2009
Firstpage :
1
Lastpage :
10
Abstract :
An X-tolerant multiple-input signature register (MISR) compaction methodology that compacts output streams containing unknown (X) values was described in [Touba 07]. Unlike conventional approaches, it does not use X-masking logic at the input of the MISR. Instead it uses symbolic simulation to express each bit of the MISR signature as a linear equation in terms of the X´s. Linearly dependent combinations of the signature bits are identified with Gaussian elimination and XORed together to cancel out all X values and yield deterministic values. This new X-canceling approach was applied to some industrial designs under the constraints imposed by an industrial test environment. Practical issues for implementing X-canceling are discussed, and a new architecture for implementing X-canceling based on using a shadow register with multiple selective XORs is presented. Experimental results are shown for industrial designs comparing the performance of X-canceling with X-compact.
Keywords :
automatic test pattern generation; Gaussian elimination; X-canceling MISR; linear equation; multiple-input signature register compaction; shadow register; symbolic simulation; Built-in self-test; Circuits; Clocks; Compaction; Computer industry; Design methodology; Equations; Logic design; Registers; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 2009. ITC 2009. International
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4244-4868-5
Electronic_ISBN :
978-1-4244-4867-8
Type :
conf
DOI :
10.1109/TEST.2009.5355687
Filename :
5355687
Link To Document :
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