Title :
Transistor stuck-open fault detection in multilevel CMOS circuits
Author :
Abd-El-Barr, Mostafa ; Xu, Yanging ; McCrosky, Carl
Author_Institution :
Dept. of Comput. Eng., King Fahd Univ. of Pet. & Miner., Dhahran, Saudi Arabia
Abstract :
The necessary and sufficient conditions for detecting transistor stuck-open faults in arbitrary multilevel CMOS circuits are shown. A method for representing a two-pattern test for detecting a single stuck-open fault using only one cube is presented. The relationship between the D-algorithm and the conditions for detecting transistor stuck-open faults in CMOS circuits is provided. The application of the proposed approach in robust test generation for transistor stuck-open faults in a number of benchmark circuits is demonstrated. The fault coverage achieved is as good as or better than those reported using existing techniques
Keywords :
CMOS logic circuits; automatic test pattern generation; fault location; integrated circuit testing; logic testing; multivalued logic circuits; D-algorithm; fault coverage; multilevel CMOS circuits; robust test generation; transistor stuck-open fault detection; two-pattern test; Benchmark testing; Circuit faults; Circuit testing; Computer science; DH-HEMTs; Electrical fault detection; Fault detection; Minerals; Robustness; Variable structure systems;
Conference_Titel :
VLSI, 1999. Proceedings. Ninth Great Lakes Symposium on
Conference_Location :
Ypsilanti, MI
Print_ISBN :
0-7695-0104-4
DOI :
10.1109/GLSV.1999.757464
