Title :
Cost-effective approach to improve EMI yield loss
Author :
Ko, Hsuan-Chung ; Chang, Deng-Yao ; Hu, Cheng-Nan
Author_Institution :
King Yuan Electron. Co., Ltd., Taiwan
Abstract :
This work proposes a novel ATE test approach to decrease RF testing yield loss. Background noise of the system-under-test is surveyed based on a prototype load-board equipped with a PCB antenna system to analyze the correlation between the test data and background noise in order to identify the root causes of yield loss. Experimental results of RF testing in the EMI environment correlate well with a low yield mass production scenario that is estimated to address the EMI issue.
Keywords :
automatic test equipment; integrated circuit testing; integrated circuit yield; mixed analogue-digital integrated circuits; noise; radiofrequency integrated circuits; radiofrequency interference; ATE test; EMI yield loss; PCB antenna system; RF circuits; RF testing; background noise; cost-effective approach; mixed signal circuits; system-under-test; yield mass; Bandwidth; Circuit testing; Digital modulation; Electromagnetic interference; Electromagnetic measurements; Electronic equipment testing; Frequency measurement; GSM; Radio frequency; System testing;
Conference_Titel :
Test Conference, 2009. ITC 2009. International
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4244-4868-5
Electronic_ISBN :
978-1-4244-4867-8
DOI :
10.1109/TEST.2009.5355696
