Cost-effective approach to improve EMI yield loss

Author

Ko, Hsuan-Chung ; Chang, Deng-Yao ; Hu, Cheng-Nan

Author_Institution

King Yuan Electron. Co., Ltd., Taiwan

fYear

2009

fDate

1-6 Nov. 2009

Firstpage

1

Lastpage

8

Abstract

This work proposes a novel ATE test approach to decrease RF testing yield loss. Background noise of the system-under-test is surveyed based on a prototype load-board equipped with a PCB antenna system to analyze the correlation between the test data and background noise in order to identify the root causes of yield loss. Experimental results of RF testing in the EMI environment correlate well with a low yield mass production scenario that is estimated to address the EMI issue.

Keywords

automatic test equipment; integrated circuit testing; integrated circuit yield; mixed analogue-digital integrated circuits; noise; radiofrequency integrated circuits; radiofrequency interference; ATE test; EMI yield loss; PCB antenna system; RF circuits; RF testing; background noise; cost-effective approach; mixed signal circuits; system-under-test; yield mass; Bandwidth; Circuit testing; Digital modulation; Electromagnetic interference; Electromagnetic measurements; Electronic equipment testing; Frequency measurement; GSM; Radio frequency; System testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 2009. ITC 2009. International

Conference_Location

Austin, TX

Print_ISBN

978-1-4244-4868-5

Electronic_ISBN

978-1-4244-4867-8

Type

conf

DOI

10.1109/TEST.2009.5355696

Filename

5355696