• DocumentCode
    2704869
  • Title

    Clean Tablet; innovation on the IC packaging material and process

  • Author

    Saito, Kiyoshi ; Ohno, Hirofumi ; Taruno, Tomohiro ; Nishioka, Tsutomu

  • Author_Institution
    Dept. of Packaging Products, Nitto Denko Corp., Mie, Japan
  • fYear
    1995
  • fDate
    21-24 May 1995
  • Firstpage
    1230
  • Lastpage
    1233
  • Abstract
    In the field of the IC packaging, almost every device assembled in the molding process with a thermosetting resin formed into a tablet. The trend for down sizing and integration of the IC devices brings the molding process into the clean room, and demands the package itself to be without failures like void, unfilling and so on. However the current molding tablets are made of powder resin compound by punching, so that they generate the dust and sometimes have been cracked during the transportation and storage. With the above circumstances, we have innovated a new production process of the molding tablets, Clean Tablet. Key technologies in this development are precise control of reacting conversion of the compound as well as weight, dimension and compression ratio of the tablet. Finally we have developed a new machine that is composed of feeder, kneader and tablet former mutually connected and controlled. This new machine can make almost all kinds of compound and sizes of the mold compounds currently available for Multi-Plunger Transfer Molding System. The newly developed Clean Tablet has following features. (1) Extremely high density, up to 98-100%, compared to 96% max of the conventional type. (2) no dust and less cracking. (3) Yield loss of the package due to voids and pinholes generated by air and volatility in the tablets is extremely low
  • Keywords
    clean rooms; cracks; integrated circuit packaging; integrated circuit yield; plastic packaging; Clean Tablet; IC packaging; clean room; compression ratio; cracking; molding process; multi-plunger transfer molding system; pinholes; production process; thermosetting resin; voids; yield loss; Assembly; Integrated circuit packaging; Manufacturing processes; Plastic integrated circuit packaging; Production; Pulp manufacturing; Resins; Semiconductor device packaging; Sheet materials; Technological innovation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 1995. Proceedings., 45th
  • Conference_Location
    Las Vegas, NV
  • Print_ISBN
    0-7803-2736-5
  • Type

    conf

  • DOI
    10.1109/ECTC.1995.517847
  • Filename
    517847