Title :
Microprocessor system failures debug and fault isolation methodology
Author :
Amyeen, M. Enamul ; Venkataraman, Srikanth ; Mak, Mun Wai
Author_Institution :
Intel Corp., Hillsboro, OR, USA
Abstract :
Diagnosis of functional failures can be used to debug design issues, isolate manufacturing defects, and improve manufacturing yield. Automated failure analysis and rapid root-cause isolation is critical for meeting ever decreasing product time to market demand. Conventional debug approach requires in-depth architecture knowledge and debug expertise. In this paper, we present a two phase approach for isolating microprocessor functional failures. First, failing functional blocks are identified utilizing functional fault simulation. Then, algorithmic diagnosis techniques are applied to accurately identify the failing signals within a functional block. Results are presented showing successful isolation of silicon defects on Intel® Core¿ dual-core processor.
Keywords :
failure analysis; fault simulation; integrated circuit reliability; integrated circuit testing; microprocessor chips; Intel Core dual-core processor; algorithmic diagnosis techniques; automated failure analysis; debug methodology; failing functional blocks; failing signals; fault isolation methodology; functional failure diagnosis; functional fault simulation; manufacturing defects; manufacturing yield; microprocessor system; rapid root-cause isolation; two phase approach; Analytical models; Automatic testing; Circuit faults; Circuit testing; Failure analysis; Fault diagnosis; Manufacturing; Microprocessors; Signal analysis; System testing;
Conference_Titel :
Test Conference, 2009. ITC 2009. International
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4244-4868-5
Electronic_ISBN :
978-1-4244-4867-8
DOI :
10.1109/TEST.2009.5355702
