DocumentCode
2705004
Title
Fluidic self-assembly of silicon microstructures
Author
Verma, Ashish K. ; Hadley, Mark A. ; Yeh, Hsi-Jen J. ; Smith, J.S.
Author_Institution
Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA, USA
fYear
1995
fDate
21-24 May 1995
Firstpage
1263
Lastpage
1268
Abstract
Fluidic self-assembly is a new technique which makes possible the integration of devices fabricated using dissimilar materials and processes. The integration is accomplished by fluidically transporting trapezoidally shaped blocks made of one material into similarly shaped holes in a receptor substrate. In this paper, a systematic study of the FSA integration efficiency is presented. Blocks and holes were formed from silicon using anisotropic etching. Two different sizes were considered: large blocks of dimension 1.0 mm×1.2 mm, and small blocks of dimension 150 μm×150 μm. FSA was performed in either water or methanol using a bubble pump apparatus to recirculate blocks. FSA of large blocks resulted in 100% filling of a substrate containing 191 holes within 2.5 minutes. Similar experiments with small blocks and a substrate with a 64×64 array of holes yielded a fill ratio of 70%, due to undesirable adhesion of blocks to the substrate surface. Roughening the substrate resulted in a fill ratio of 90%. Also presented is a simple rate equation model of the FSA process, along with a discussion of which process parameters are important and how they can be optimized
Keywords
elemental semiconductors; etching; integrated circuit technology; microassembling; semiconductor technology; silicon; substrates; 1.0 mm; 1.2 mm; 150 micron; FSA integration efficiency; Si; anisotropic etching; bubble pump apparatus; fill ratio; fluidic self-assembly; process parameters; rate equation model; substrate pattern; trapezoidally shaped blocks; Adhesives; Anisotropic magnetoresistance; Etching; Filling; Fluidic microsystems; Methanol; Microfluidics; Microstructure; Self-assembly; Silicon;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 1995. Proceedings., 45th
Conference_Location
Las Vegas, NV
Print_ISBN
0-7803-2736-5
Type
conf
DOI
10.1109/ECTC.1995.517853
Filename
517853
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