Title :
Improved optoelectronic mixing of InAlAs/InGaAs interdigitated-finger metal-semiconductor-metal photodetectors
Author :
Aliberti, K. ; Shen, H. ; Ruff, W. ; Stann, B. ; Newman, P. ; Semendy, F. ; Stead, M. ; Mehandru, R. ; Ren, F.
Author_Institution :
US Army Res. Lab., Adelphi, MD, USA
Abstract :
We analyze the optoelectronic mixing characteristics of an InAlAs, Schottky-enhanced, InGaAs-based metal-semiconductor-metal photodetector. We show that the mixing efficiency of this device depends on the thickness of the InAlAs Schottky-enhancement layer: For thick enhancement layers (≈ 500 Å), the bandwidth of the device when utilized as an optoelectronic mixer is less than the bandwidth of the device when utilized as a simple photodetector. In addition, the mixing efficiency depends on the light-modulation, local-oscillator, and mixed-signal frequencies, and decreases nonlinearly with decrease in optical power. For thin enhancement layers (≈ 100 Å), the mixing characteristics improve: The bandwidth of the optoelectronic mixer is similar to that of a corresponding photodetector and the mixing efficiency decreases only slightly with decrease in optical power. We attribute the observed behavior to the band-gap discontinuity associated with the InAlAs Schottky enhancement layer.
Keywords :
III-V semiconductors; Schottky barriers; aluminium compounds; gallium arsenide; indium compounds; integrated optoelectronics; metal-semiconductor-metal structures; photodetectors; 100 Å; 500 Å; InAlAs Schottky-enhancement layer; InAlAs-InGaAs; InAlAs/InGaAs interdigitated-finger metal-semiconductor-metal photodetectors; bandwidth; mixing efficiency; optoelectronic mixing; thin enhancement layers; Bandwidth; Frequency; High speed optical techniques; Indium compounds; Indium gallium arsenide; Optical mixing; Optical modulation; Optical scattering; Photodetectors; RF signals;
Conference_Titel :
Sensors, 2003. Proceedings of IEEE
Print_ISBN :
0-7803-8133-5
DOI :
10.1109/ICSENS.2003.1279097