Title :
BIST scheme for RF VCOs allowing the self-correction of the cut
Author :
Testa, L. ; Lapuyade, H. ; Deval, Y. ; Mazouffre, O. ; Carbonero, J.L. ; Begueret, J.B.
Author_Institution :
IMS Lab., Bordeaux, France
Abstract :
In order to implement a built-in self-test (BIST) strategy for a radio frequency (RF) LC-voltage controlled oscillator (VCO) devoted to WiMax applications, an exhaustive study of the fault coverage achievable for this block is carried out. The peak-to-peak value of the output voltage is shown to be the best quantity to monitor. Once the fault is detected, it is shown that the BIST can be exploited as well to trigger a feedback allowing, in some cases, the self-correction of the VCO. The complete system is designed using the STM CMOS 65 nm process.
Keywords :
CMOS integrated circuits; built-in self test; integrated circuit testing; radiofrequency oscillators; voltage-controlled oscillators; BIST scheme; CUT; RF VCO; STM CMOS process; Wimax application; built-in self-test; circuit under test; fault coverage; radio frequency LC-voltage controlled oscillator; self-correction; size 65 nm; Built-in self-test; CMOS process; Fault detection; Feedback; Monitoring; Radio control; Radio frequency; Voltage; Voltage-controlled oscillators; WiMAX; BIST; Fault coverage; Peak-to-peak voltage detector; RF; Self-correction; VCO;
Conference_Titel :
Test Conference, 2009. ITC 2009. International
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4244-4868-5
Electronic_ISBN :
978-1-4244-4867-8
DOI :
10.1109/TEST.2009.5355721
