• DocumentCode
    2705420
  • Title

    A2DTest: A complete integrated solution for on-chip ADC self-test and analysis

  • Author

    Mullane, Brendan ; Brien, Vincent O. ; MacNamee, Ciaran ; Fleischmann, Thomas

  • Author_Institution
    Dept. of Electron. & Comput. Eng., Univ. of Limerick, Limerick, Ireland
  • fYear
    2009
  • fDate
    1-6 Nov. 2009
  • Firstpage
    1
  • Lastpage
    10
  • Abstract
    An on-chip BIST solution performing accurate ADC measurements is presented. The platform enables linear and dynamic testing to occur in parallel, significantly lowering test time and cost. On-chip hardware resources are optimized for ADC test application.
  • Keywords
    analogue-digital conversion; built-in self test; A2DTest; onchip ADC self-test; onchip BIST solution; onchip hardware resources; Built-in self-test; Central Processing Unit; Circuit testing; Costs; Digital signal processing; Engines; Histograms; Integrated circuit measurements; Performance evaluation; Semiconductor device testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2009. ITC 2009. International
  • Conference_Location
    Austin, TX
  • Print_ISBN
    978-1-4244-4868-5
  • Electronic_ISBN
    978-1-4244-4867-8
  • Type

    conf

  • DOI
    10.1109/TEST.2009.5355722
  • Filename
    5355722
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2705420