Title :
A2DTest: A complete integrated solution for on-chip ADC self-test and analysis
Author :
Mullane, Brendan ; Brien, Vincent O. ; MacNamee, Ciaran ; Fleischmann, Thomas
Author_Institution :
Dept. of Electron. & Comput. Eng., Univ. of Limerick, Limerick, Ireland
Abstract :
An on-chip BIST solution performing accurate ADC measurements is presented. The platform enables linear and dynamic testing to occur in parallel, significantly lowering test time and cost. On-chip hardware resources are optimized for ADC test application.
Keywords :
analogue-digital conversion; built-in self test; A2DTest; onchip ADC self-test; onchip BIST solution; onchip hardware resources; Built-in self-test; Central Processing Unit; Circuit testing; Costs; Digital signal processing; Engines; Histograms; Integrated circuit measurements; Performance evaluation; Semiconductor device testing;
Conference_Titel :
Test Conference, 2009. ITC 2009. International
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4244-4868-5
Electronic_ISBN :
978-1-4244-4867-8
DOI :
10.1109/TEST.2009.5355722
