DocumentCode
2705495
Title
Novel curve fitting design methodology for carbon nanotube SRAM cell optimization
Author
Wang, Wei ; Choi, Ken
Author_Institution
Dept. of Electr. & Comput. Eng., Illinois Inst. of Technol., Chicago, IL, USA
fYear
2010
fDate
20-22 May 2010
Firstpage
1
Lastpage
6
Abstract
Unlike CMOS circuit design, even though there are promising advantages to use carbon nanotubes for digital circuits in terms of power, delay, temperature, and area, one of the critical issues to design by using carbon nanotubes is optimization of additional design parameters such as number of nanotubes and pitch size. To reduce the optimization complexity of the increased technology parameters, in this paper, we proposed a novel curve fitting design methodology for carbon-nanotube circuits. The proposed curve fitting methodology can guarantee from 90% to 100% correlation accuracy comparing with SPICE simulation and it can find optimal CNFET SRAM cell parameters without exhaustive simulation time and large memory space. The optimized CNFET SRAM cell by the proposed methodology shows that total power consumption including static power is reduced by 83.14% and the total PDP (product of delay and power) is reduced by 83.39%, comparing with CMOS SRAM cell design. The total runtime is reduced by 96.9% compared with conventional Monte Carlo simulation method in SPICE.
Keywords
CMOS logic circuits; Monte Carlo methods; SPICE; SRAM chips; carbon nanotubes; circuit complexity; circuit optimisation; circuit simulation; curve fitting; logic design; C; CMOS circuit design; CNFET SRAM cell parameters; Monte Carlo simulation method; SPICE simulation; carbon nanotube SRAM cell optimization; carbon nanotubes; carbon-nanotube circuits; correlation accuracy; curve fitting design methodology; design parameters; digital circuits; large memory space; optimization complexity; pitch size; power consumption; simulation time; static power; technology parameters; CNTFETs; Delay; Equations; Mathematical model; Optimization; Random access memory; Writing;
fLanguage
English
Publisher
ieee
Conference_Titel
Electro/Information Technology (EIT), 2010 IEEE International Conference on
Conference_Location
Normal, IL
ISSN
2154-0357
Print_ISBN
978-1-4244-6873-7
Type
conf
DOI
10.1109/EIT.2010.5612138
Filename
5612138
Link To Document