Title :
A new low switching noise CMOS logic circuits for single-chip CMOS imaging system
Author :
Chung, Hoon Hee ; Rhee, Jehyuk ; Joo, Youngjoong
Author_Institution :
Dept. of Electr. Eng., Arizona State Univ., Tempe, AZ, USA
Abstract :
In this paper, we present a new low switching noise CMOS logic for on-chip CMOS image sensors, which reduce the switching noise through the substrate. The instantaneous peak current in digital system is the main source of the substrate noise and the injected current noise propagates through highly doped substrate and contaminates the sensitive image sensing systems. AMI 0.5 μm CMOS technology is used for the analysis of switching noise. Simulation results show that the proposed logic generates lower ground bounce compare to the other low noise logic circuits. As a result it enables system-on-chip CMOS imaging system to be less susceptible to switching noise than when using other low noise logics.
Keywords :
CMOS image sensors; integrated circuit noise; logic circuits; semiconductor device noise; 0.5 micron; injected current noise; instantaneous peak current; low noise logic circuits; low switching noise CMOS logic circuits; sensitive image sensing systems; single-chip CMOS imaging system; substrate noise; Ambient intelligence; CMOS image sensors; CMOS logic circuits; CMOS technology; Circuit noise; Circuit simulation; Digital systems; Logic circuits; Noise reduction; Switching circuits;
Conference_Titel :
Sensors, 2003. Proceedings of IEEE
Print_ISBN :
0-7803-8133-5
DOI :
10.1109/ICSENS.2003.1279122