DocumentCode
2705765
Title
Contact stress relaxation and resistance change relationships in accelerated heat age testing
Author
Beach, Kimberly L. ; Pascucci, Vincent C.
fYear
2000
fDate
25-27 Sept. 2000
Firstpage
1
Lastpage
17
Abstract
This paper reviews the development of the present practice of heat age reliability testing, (temperature life testing), and formally identifies and addresses the inherent concerns of this procedure. A 302 day heat age test has been completed to evaluate the resistance behavior of two D-subminiature contacts at three different elevated temperatures. The results indicate that in heat age conditioning, resistance is affected by mechanisms other than normal force degradation. Furthermore, the effect reduction in normal force has on a contact may not be evident unless the contact is disturbed. Therefore, changes in resistance as a result of heat aging are not necessarily indicative of changes that may occur due to loss of normal force in actual use. This investigation suggests that accelerated heat age testing should be primarily used as a preconditioning test prior to exposing contacts to other environments where reduced normal force may make contacts more susceptible to other failure mechanisms.
Keywords
ageing; contact resistance; electrical contacts; electronic equipment testing; failure analysis; life testing; reliability; stress relaxation; thermal stresses; 302 day; D-subminiature contacts; accelerated heat age testing; contact environmental exposure; contact resistance change; contact stress relaxation; elevated temperatures; failure mechanisms; heat age conditioning; heat age reliability testing; heat age test; heat aging; normal force degradation; normal force reduction effect; preconditioning test; resistance behavior; resistance change mechanisms; temperature life testing; Accelerated aging; Contact resistance; Copper; Degradation; Electronic equipment testing; Life estimation; Resistance heating; Stress; Temperature; Wire;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Contacts, 2000. Proceedings of the Forty-Sixth IEEE Holm Conference on
Conference_Location
Chicago, IL, USA
Print_ISBN
0-7803-5960-7
Type
conf
DOI
10.1109/HOLM.2000.889906
Filename
889906
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