Title :
A low-photocurrent CMOS retinal focal-plane sensor with pseudo-BJT smoothing network and adaptive current Schmitt trigger for scanner applications
Author :
Wu, Chung-Yu ; Chian, Cheng-Ta
Author_Institution :
Dept. of Electron. Eng., Nat. Chiao Tung Univ., Hsing Chu, Taiwan
Abstract :
In this paper, a new structure of low-photocurrent CMOS retinal focal-plane sensor with pseudo-BJT smoothing network and adaptive current Schmitt trigger is proposed. The proposed structure is very simple and compact. This new circuit can be easily implemented in CMOS technology with a small chip area. Besides, another innovation of this circuit is that the proposed circuit could be operated for low-induced current level (pA), and the current hysteresis of proposed current Schmitt trigger could be adjusted adaptively according to the value of induced photocurrent. In this paper, the detection of static and moving objects, such as a moving white bar, are proven by projecting a pattern through HSPICE simulation. The proposed retinal focal-plane sensor includes 32 × 32 pixel array with a pixel size of 70 × 70 μm2. The fill factor is 75% and the total chip area is 3000 × 3030 μm2. It is with fully functional 32 × 32 implementations consuming less than 8.8 μW per pixel at 3.3 V. Measurement results present the proposed retinal focal-plane sensor could be successfully used in character recognition, such as pen-scanner or etc.
Keywords :
CMOS image sensors; bipolar transistors; eye; photodetectors; trigger circuits; 3.3 V; 3000 micron; 3030 micron; 70 micron; HSPICE simulation; adaptive current Schmitt trigger; induced photocurrent; low-induced current level; low-photocurrent CMOS retinal focal-plane sensor; moving white bar; pseudo-BJT smoothing network; retinal focal-plane sensor; scanner applications; small chip area; Adaptive systems; CMOS technology; Hysteresis; Object detection; Photoconductivity; Retina; Sensor arrays; Smoothing methods; Technological innovation; Trigger circuits;
Conference_Titel :
Sensors, 2003. Proceedings of IEEE
Print_ISBN :
0-7803-8133-5
DOI :
10.1109/ICSENS.2003.1279124