• DocumentCode
    2705990
  • Title

    Study and reliability analysis on testing instrument for dynamic contact resistance on contact

  • Author

    Wen-hua Li ; Liu, Cuo-jin ; Li, Wen-hua

  • Author_Institution
    Hebei Univ. of Technol., Tianjin, China
  • fYear
    2000
  • fDate
    25-27 Sept. 2000
  • Firstpage
    109
  • Lastpage
    114
  • Abstract
    In this paper, a new testing instrument for dynamic contact resistance of low capacity contacts is introduced in detail. By means of this testing instrument, we carried out a series of experiments. In early experiments, we tested several types of industrial control relays under different temperatures and operation times, and accumulated a great deal of experimental data. By statistical analysis of the test data, we drew some qualitative conclusions. Further experiments and reliability analyses are ongoing. A mathematical model of the contact resistance of electrical apparatus contacts and its dynamic changing principle are preliminarily discussed.
  • Keywords
    contact resistance; electrical contacts; electronic equipment testing; industrial control; relays; reliability; statistical analysis; test equipment; contact; contact resistance; dynamic contact resistance; dynamic contact resistance changing principle; electrical apparatus contacts; industrial control relays; low capacity contacts; mathematical model; reliability; reliability analysis; statistical analysis; test data; test operation times; test temperature; testing instrument; Buffer storage; Circuit noise; Circuit testing; Coils; Contact resistance; Electromagnetic interference; Hardware; Instruments; Mathematical model; Oscilloscopes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Contacts, 2000. Proceedings of the Forty-Sixth IEEE Holm Conference on
  • Conference_Location
    Chicago, IL, USA
  • Print_ISBN
    0-7803-5960-7
  • Type

    conf

  • DOI
    10.1109/HOLM.2000.889919
  • Filename
    889919