DocumentCode
2705990
Title
Study and reliability analysis on testing instrument for dynamic contact resistance on contact
Author
Wen-hua Li ; Liu, Cuo-jin ; Li, Wen-hua
Author_Institution
Hebei Univ. of Technol., Tianjin, China
fYear
2000
fDate
25-27 Sept. 2000
Firstpage
109
Lastpage
114
Abstract
In this paper, a new testing instrument for dynamic contact resistance of low capacity contacts is introduced in detail. By means of this testing instrument, we carried out a series of experiments. In early experiments, we tested several types of industrial control relays under different temperatures and operation times, and accumulated a great deal of experimental data. By statistical analysis of the test data, we drew some qualitative conclusions. Further experiments and reliability analyses are ongoing. A mathematical model of the contact resistance of electrical apparatus contacts and its dynamic changing principle are preliminarily discussed.
Keywords
contact resistance; electrical contacts; electronic equipment testing; industrial control; relays; reliability; statistical analysis; test equipment; contact; contact resistance; dynamic contact resistance; dynamic contact resistance changing principle; electrical apparatus contacts; industrial control relays; low capacity contacts; mathematical model; reliability; reliability analysis; statistical analysis; test data; test operation times; test temperature; testing instrument; Buffer storage; Circuit noise; Circuit testing; Coils; Contact resistance; Electromagnetic interference; Hardware; Instruments; Mathematical model; Oscilloscopes;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Contacts, 2000. Proceedings of the Forty-Sixth IEEE Holm Conference on
Conference_Location
Chicago, IL, USA
Print_ISBN
0-7803-5960-7
Type
conf
DOI
10.1109/HOLM.2000.889919
Filename
889919
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