• DocumentCode
    2706027
  • Title

    Development of an application specific integrated circuit for reduction of contact bounce in three phase contactors

  • Author

    Kiely, J.H. ; Nouri, H. ; Kalvelage, F. ; Davies, TS

  • Author_Institution
    Fac. of Eng., West of England Univ., Bristol, UK
  • fYear
    2000
  • fDate
    25-27 Sept. 2000
  • Firstpage
    120
  • Lastpage
    129
  • Abstract
    In this paper, a miniature control device capable of reducing contact bounce in three phase contactors is presented. The device is implemented using Alcatel-Mietec 2 /spl mu/m integrated circuit technology and operates by controlling the strength of the kinetic energy of the field flux by timing the coil energisation periods. The device performance is evaluated through a series of tests with line-to-line voltages of 75 and 300 V and a gap length of 2 mm. Results demonstrate that, with the appropriate input settings to the control device, it is possible to eliminate contact bounce substantially in all three phases. The mechanical characteristics of the contactor system determine the required setting for zero bounce. The ability to vary the input data results in a device which can be tailored to application with any type of switchgear. On completion of 5000 switching operations using the control device, the active area of erosion on each of the contact surfaces is reduced by a factor of up to 28% compared with contacts from tests where no control device is used. Furthermore, comparisons with previous studies indicate that the majority of the erosion that occurs with controlled switching is caused by arcing during the opening operation. Hence, it can be concluded that the frequency and duration of the arcs which occur during closing are substantially reduced by the use of the control device.
  • Keywords
    application specific integrated circuits; arcs (electric); contactors; integrated circuit design; integrated circuit technology; integrated circuit testing; switchgear; wear; 2 micron; 2 mm; 300 V; 75 V; Alcatel-Mietec integrated circuit technology; active erosion area; application specific integrated circuit; arc duration; arc frequency; arcing; coil energisation period timing; contact bounce; contact bounce reduction; contact surfaces; contactor system; control device; controlled switching; device performance; erosion; field flux kinetic energy strength; gap length; input data; input settings; line-to-line test voltage; mechanical characteristics; miniature control device; opening operation; switchgear; switching operations; three phase contactors; zero bounce setting; Application specific integrated circuits; Circuit testing; Coils; Contactors; Frequency; Integrated circuit technology; Kinetic energy; Switchgear; Timing; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Contacts, 2000. Proceedings of the Forty-Sixth IEEE Holm Conference on
  • Conference_Location
    Chicago, IL, USA
  • Print_ISBN
    0-7803-5960-7
  • Type

    conf

  • DOI
    10.1109/HOLM.2000.889921
  • Filename
    889921