• DocumentCode
    2706115
  • Title

    An economical, precise and limited access In-Circuit Test method for pulse-width modulation (PWM) circuits

  • Author

    Yeh, Albert ; Chou, Jesse ; Lin, Max

  • Author_Institution
    Test Res. Inc., Taipei, Taiwan
  • fYear
    2009
  • fDate
    1-6 Nov. 2009
  • Firstpage
    1
  • Lastpage
    9
  • Abstract
    A technology is introduced that tests PWM circuits using a newly-developed single high-impedance test sensor probe versus the traditional in-circuit test (ICT) methods. Test accuracy is achieved while on-board test points and fixture probes are significantly reduced.
  • Keywords
    integrated circuit testing; printed circuit testing; probes; pulse width modulation; PWM circuits; high-impedance test sensor probe; in-circuit test; on-board test points; pulse width modulation circuits; Circuit testing; MOSFET circuits; Power semiconductor switches; Power supplies; Probes; Pulse circuits; Pulse width modulation; Space vector pulse width modulation; Switching circuits; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2009. ITC 2009. International
  • Conference_Location
    Austin, TX
  • Print_ISBN
    978-1-4244-4868-5
  • Electronic_ISBN
    978-1-4244-4867-8
  • Type

    conf

  • DOI
    10.1109/TEST.2009.5355755
  • Filename
    5355755
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2706115