Application of low temperature plasma modification explore the technical processing of nano HMX

Author

Xiaode Guo ; Binbin Dong ; Fengsheng Li ; Zhixiang Wang ; Fei Wu

Author_Institution

Nat. Special Superfine Powder Eng. Res. Center of China, Nanjing Univ. of Sci. & Technol., Nanjing, China

fYear

2015

fDate

23-25 April 2015

Firstpage

38

Lastpage

41

Abstract

Firstly, use the low temperature plasma equipment to process nano HMX. Then, use The dispersion and the morphology of nano HMX were characterized by Wet Zetasizer Nano and scanning electron microscope (SEM). Use fourier transform infrared spectrometer (FT-IY) and X-ray powder diffraction X-ray diffraction (XRD) and X-ray photoelectron spectrometer (XPS) to analyze its main composition, structure and surface element valence state changes. Finally, differential scanning calorimetry-thermogravimetric analysis (TG-DSC) to analyze the nanometer HMX thermal decomposition characteristics. Use the impact sensitivity test instrument to test its impact sensitivity. The result shows that treated nano HMX reunion reduce dispersion becomes better, treated nano HMX lower impact sensitivity of 8.1%, whitch improved its safety.

Keywords

Fourier transform infrared spectra; X-ray diffraction; X-ray photoelectron spectra; differential scanning calorimetry; explosives; nanostructured materials; plasma materials processing; powder technology; scanning electron microscopy; Fourier transform infrared spectrometer; X-ray photoelectron spectrometer; X-ray powder diffraction; differential scanning calorimetry-thermogravimetric analysis; low-temperature dispersion modification; low-temperature plasma equipment; nanoHMX morphology; nanometer HMX thermal decomposition characteristics; scanning electron microscope; surface element valence state; Dispersion; Nanoparticles; Plasma temperature; Sensitivity; Temperature; Thermal decomposition; dispersion; impact sensitivity; low temperature plasma; nano HMX; the thermal decomposition characteristics;

fLanguage

English

Publisher

ieee

Conference_Titel

Defence Technology (ACDT), 2015 Asian Conference on

Conference_Location

Hua Hin

Print_ISBN

978-1-4799-8166-3

Type

conf

DOI

10.1109/ACDT.2015.7111580

Filename

7111580