Title :
Analysis of semi-anechoic chamber using ray-tracing technique
Author :
Anzai, Hiroki ; Kishimoto, Takeshi ; Yamazaki, Takashi ; Naito, Yoshiyuki ; Mizumoto, Tetsuya
Author_Institution :
Dept. of Phys. Electron., Tokyo Inst. of Technol., Japan
Abstract :
A semi-anechoic chamber is known to be useful for EMC measurements in a frequency range from 30 MHz to 1000 MHz. The analysis using a ray-tracing technique is investigated to evaluate a normalized site attenuation in the semi-anechoic chamber which is used for EMC measurements in a 3 m or 10 m method. The validity of the analysis is verified for a chamber lined with a multi-layer ferrite absorber by comparison with experimental data. The analysis is also applied to estimate the thickness of pyramidal absorber required to satisfy the ANSI standard
Keywords :
UHF measurement; anechoic chambers; attenuation measurement; electromagnetic compatibility; electromagnetic wave absorption; ferrites; ray tracing; 10 m; 10 m measurement method; 3 m; 3 m measurement method; 30 to 1000 MHz; ANSI standard; EMC measurements; UHF; VHF; experimental data; frequency range; multilayer ferrite absorber; normalized site attenuation; pyramidal absorber thickness; ray tracing technique; semianechoic chamber; Attenuation; Conductors; Dielectrics; Dipole antennas; Electromagnetic compatibility; Ferrites; Optical reflection; Ray tracing; Receiving antennas; Transmitting antennas;
Conference_Titel :
Electromagnetic Compatibility, 1996. Symposium Record. IEEE 1996 International Symposium on
Conference_Location :
Santa Clara, CA
Print_ISBN :
0-7803-3207-5
DOI :
10.1109/ISEMC.1996.561217
