DocumentCode
2706192
Title
Correlation between arcing phenomena and electromagnetic noise of opening electric contacts
Author
Ebara, Yasuo ; Sone, Hideaki ; Nemoto, Yoshiaki
Author_Institution
Graduate Sch. of Inf. Sci., Tohoku Univ., Sendai, Japan
fYear
2000
fDate
25-27 Sept. 2000
Firstpage
191
Lastpage
197
Abstract
The authors observed the electromagnetic noise and surface change for a Cu-C electric contact as a simulation model of a commutator motor. In case of Cu-C (anode-cathode), the duration of sporadic burst noise generates from arc discharge. The patterns of the burst noise at the start of the arc are classified into three types, and the pattern of surface change corresponds to each pattern. When burst noise duration increases, the melted area has a wide distribution on the electrode surfaces and the authors have found a correlation between burst noise and the electrode surface area. From these results, the authors proposed a method of noise control by controlling the melted area and showed a fundamental noise control technique by electrode design with consideration of the electrode form.
Keywords
anodes; brushes; burst noise; carbon; cathodes; circuit-breaking arcs; commutator motors; copper; electrical contacts; interference suppression; melting; pattern classification; surface structure; Cu-C; Cu-C anode-cathode contact; Cu-C electric contact; arc discharge; arcing phenomena; burst noise; burst noise duration; burst noise pattern classification; commutator motor; correlation; electrode design; electrode form; electrode surface area; electrode surface distribution; electromagnetic noise; melted area; melted area control; noise control; noise control technique; opening electric contacts; simulation model; sporadic burst noise; surface change; surface change pattern; Arc discharges; Circuit noise; Electrodes; Electromagnetic interference; Electromagnetic measurements; Noise generators; Noise measurement; Power measurement; Surface discharges; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Contacts, 2000. Proceedings of the Forty-Sixth IEEE Holm Conference on
Conference_Location
Chicago, IL, USA
Print_ISBN
0-7803-5960-7
Type
conf
DOI
10.1109/HOLM.2000.889929
Filename
889929
Link To Document