Title :
The design of a multifunctional test apparatus-LISN Used for conduction interference testing
Author :
Yue, Lingling ; Zhang, Xiaodong
Author_Institution :
Sch. of Electr. Eng., Beijing Jiaotong Univ., Beijing, China
Abstract :
This paper introduces a conduction interference test apparatus. It mainly introduces the conduction interference testing circuit-LISN and hardware design of the function circuit, such as: L/N line selection circuit. limiter circuit and the interface circuit between RS232 and computer.
Keywords :
circuit testing; electromagnetic interference; limiters; network synthesis; power electronics; L/N line selection circuit; LISN; conduction interference testing; function circuit; hardware design; interface circuit; limiter circuit; multifunctional test apparatus; Circuit testing; Electromagnetic compatibility; Hardware; Interference; Low pass filters; Production; Protection; Spectral analysis; Switches; System testing; LISN; RS232; limiter circuit;
Conference_Titel :
Microwave, Antenna, Propagation and EMC Technologies for Wireless Communications, 2009 3rd IEEE International Symposium on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-4076-4
DOI :
10.1109/MAPE.2009.5355760
