DocumentCode :
2706219
Title :
Millimeter wave measurements of temperature dependence of complex permittivity of dielectric plates by the cavity resonance method
Author :
Zhang, Gang ; Nakaoka, Susumu ; Kobayashi, Yoshio
Author_Institution :
Dept. of Electr. & Electron. Eng., Saitama Univ., Urawa, Japan
Volume :
3
fYear :
1997
fDate :
2-5 Dec 1997
Firstpage :
913
Abstract :
A circular cavity resonance method is discussed to measure the temperature dependence of complex permittivity of dielectric plates in the millimeter wave region. A cavity structure is cut in the middle of the length. A plate sample is placed between these two halves and is clamped with clips. The fringe effect can be estimated accurately from the rigorous analysis based on the mode matching technique. By this method, the frequency dependence of the complex permittivity for PTFE plates and new organic compound plates were measured in the frequency range between 10 and 50 GHz at room temperature, and the temperature dependence for these plates were measured at 48 GHz. It is verified that this method is useful as precise measurements of the complex permittivity of low loss dielectric plates in the microwave and millimeter wave regions
Keywords :
cavity resonators; millimetre wave measurement; mode matching; permittivity measurement; 10 to 50 GHz; PTFE; circular cavity resonance method; complex permittivity; dielectric plate; frequency dependence; fringe effect; millimeter wave measurement; mode matching; organic compound; temperature dependence; Dielectric loss measurement; Dielectric measurements; Frequency dependence; Frequency measurement; Millimeter wave measurements; Millimeter wave technology; Permittivity measurement; Resonance; Temperature dependence; Temperature measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Conference Proceedings, 1997. APMC '97, 1997 Asia-Pacific
Print_ISBN :
962-442-117-X
Type :
conf
DOI :
10.1109/APMC.1997.656347
Filename :
656347
Link To Document :
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