• DocumentCode
    2706377
  • Title

    Impacts of optoelectronics technology on ULSI

  • Author

    Hayashi, Izuo

  • fYear
    1990
  • fDate
    7-9 June 1990
  • Firstpage
    23
  • Lastpage
    26
  • Abstract
    Progress in OEIC (optoelectronic integrated-circuit) technologies is briefly reviewed, and the feasibility of optically integrated ULSI is examined. It is concluded that an overall delay time of 0.1-0.2 ns will be achievable for a bus line in ULSI using optical interconnections, which is more than one order of magnitude faster than the conventional metal wire bus line. Future prospects in optoelectronics are addressed
  • Keywords
    VLSI; integrated circuit technology; integrated optoelectronics; optical interconnections; technological forecasting; 0.1 to 0.2 ns; OEIC; ULSI; bus line; feasibility study; optical interconnect; optical interconnections; optically integrated ULSI; optoelectronic integrated-circuit; optoelectronics technology; order of magnitude faster; overall delay time;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Circuits, 1990. Digest of Technical Papers., 1990 Symposium on
  • Conference_Location
    Honolulu, Hawaii, USA
  • Type

    conf

  • DOI
    10.1109/VLSIC.1990.111077
  • Filename
    5727511