• DocumentCode
    270665
  • Title

    Improving fast S-parameter convolution by optimising reference impedance

  • Author

    Goh, P. ; Schutt-Ainé, J.E.

  • Author_Institution
    Sch. of Electr. & Electron. Eng., Univ. Sains Malaysia, Nibong Tebal, Malaysia
  • Volume
    50
  • Issue
    18
  • fYear
    2014
  • fDate
    August 28 2014
  • Firstpage
    1290
  • Lastpage
    1292
  • Abstract
    A method to perform fast transient simulations of interconnects by modelling the impulse responses of the S-parameters as discrete impulses, and then retaining only those with significant magnitudes has recently been shown to be faster than the present state-of-the-art method of curve fitting to a rational function model. An improvement to the fast convolution method by first optimising the choice of reference impedance used in the dataset is proposed. The method is seen to yield computational savings while retaining the accuracy.
  • Keywords
    convolution; curve fitting; interconnections; rational functions; transient response; curve fitting; discrete impulse response; fast S-parameter convolution; fast convolution method; fast transient simulation; interconnection; rational function model; reference impedance optimisation;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el.2014.1498
  • Filename
    6888567