Title :
Characterization of clustered microcalcifications using multiscale Hessian based feature extraction
Author :
Zyout, Imad ; Abdel-Qader, Ikhlas
Author_Institution :
Dept. of Electr. & Comput. Eng., Western Michigan Univ., Kalamazoo, MI, USA
Abstract :
Segmentation of microcalcifications (MCs) significantly influences the performance of shape-based method for the diagnosis of MCs, which continues to be a challenge as it tends to have high false positive results. Texture based characterization of MCs represents a possible alternative that does not require prior segmentation of MCs and may improve the positive predictive value of automated diagnosis of MCs. This paper presents a new approach to extracting textural features, specifically spectral measures, of mammographie MCs using multiscale Hessian filtering (or equivalently second derivative of Gaussian). Extracted features were individually ranked using Fisher-score criterion, which demonstrated the superior predictive ability of the normalized entropy. A set of mammographie regions (20 malignant and 13 benign cases) from the MIAS database were used to evaluate the classification performance of the proposed spectral features. Utilizing k-nearest neighbor classifier and ROC performance measure, the proposed Hessian based extracted features produced ROC curves with performance index Az = 0.83, which demonstrated the effectiveness of the proposed characterization scheme.
Keywords :
Hessian matrices; feature extraction; filtering theory; learning (artificial intelligence); mammography; medical image processing; pattern classification; pattern clustering; Fisher-score criterion; MIAS database; ROC performance measure; clustered microcalcifications; k-nearest neighbor classifier; mammographie regions; multiscale Hessian based feature extraction; textural features; Cancer; Eigenvalues and eigenfunctions; Feature extraction; Filter bank; Pixel; Shape; Fisher-score; Hessian based filtering; Mammographic microcalcifications; k-nearest neighbor;
Conference_Titel :
Electro/Information Technology (EIT), 2010 IEEE International Conference on
Conference_Location :
Normal, IL
Print_ISBN :
978-1-4244-6873-7
DOI :
10.1109/EIT.2010.5612193