DocumentCode :
2706695
Title :
Analysis of the effect of ferrite tile gap on EMC chamber having ferrite absorber walls
Author :
Liu, Kefeng
Author_Institution :
EMC Test Systems, Austin, TX, USA
fYear :
1996
fDate :
19-23 Aug 1996
Firstpage :
156
Lastpage :
161
Abstract :
It has been known that air gaps between ferrite tiles degrade the absorbing performance of the tile absorber wall installation. However, analysis of the effect has not been thoroughly well published. This paper presents two techniques to analyze gaps between ferrite tiles. A simplified magnetic circuit method is introduced to calculate the effective permeability of the tile wall with gaps. Then, a two-dimensional finite element method is used to analyze the same gap model to validate the simplified formula. The air gap formula is then incorporated into characterizing the ferrite tile absorber with or without a dielectric absorber as its matching element. The fully characterized ferrite absorbers can then be used to design EMC chambers. Design examples are, presented to demonstrate the correlation between calculated and measured normalized site attenuations for 10 m/3 m EMC semi-anechoic chambers
Keywords :
anechoic chambers; attenuation measurement; electromagnetic compatibility; electromagnetic wave absorption; ferrites; finite element analysis; magnetic circuits; permeability; 10 m; 3 m; EMC chamber design; EMC measurements; EMC semianechoic chambers; absorbing performance; air gap formula; calculated normalized site attenuation; correlation; dielectric absorber; effective permeability; ferrite absorber walls; ferrite tile gap; gap model; magnetic circuit method; matching element; measured normalized site attenuation; tile absorber wall installation; two-dimensional finite element method; Air gaps; Degradation; Dielectrics; Electromagnetic compatibility; Ferrites; Finite element methods; Magnetic analysis; Magnetic circuits; Permeability; Tiles;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility, 1996. Symposium Record. IEEE 1996 International Symposium on
Conference_Location :
Santa Clara, CA
Print_ISBN :
0-7803-3207-5
Type :
conf
DOI :
10.1109/ISEMC.1996.561220
Filename :
561220
Link To Document :
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