Title :
On the entropy rate of pattern processes
Author :
Gemelos, George M. ; Weissman, Tsachy
Author_Institution :
Dept. of Electr. Eng., Stanford Univ., CA, USA
Abstract :
Recent work by Orlitsky et al. (2004) has motivated the study of pattern sequences and their compressibility properties. Emphasis in this recent line of work has been on compressing pattern sequences under uncertainty in the source that has generated them, thus focusing on universal schemes and their redundancy. Our interest in this work is in the entropy rate of pattern sequences of stochastic processes, and its relationship to the entropy rate of the original process. We give a complete characterization of this relationship for i.i.d. processes over arbitrary alphabets, stationary and ergodic: processes over discrete alphabets, as well as more general processes that can be represented as the output of an additive white-noise channel. For cases where the entropy rate of the pattern process is infinite, we characterize the possible growth rate of the block entropy.
Keywords :
AWGN channels; binary sequences; channel capacity; entropy codes; source coding; additive white-noise channel; block entropy; compressibility properties; discrete alphabets; entropy rate; ergodic alphabets; growth rate; i.i.d. processes; pattern processes; pattern sequences; stationary alphabets; stochastic processes; Data compression; Entropy; Random processes; Stochastic processes; Uncertainty;
Conference_Titel :
Data Compression Conference, 2005. Proceedings. DCC 2005
Print_ISBN :
0-7695-2309-9
DOI :
10.1109/DCC.2005.63