Title :
A novel multisite testing techniques by using frequency synthesizer
Author :
Kim, Boyon ; Park, Il-Chan ; Song, Giseob ; Choi, Wooseong ; Kim, Byeong-Yun ; Lee, Kyutaek ; Choi, Chi-young
Author_Institution :
Samsung Electron. Co. Ltd., Yongin, South Korea
Abstract :
Same output frequencies at each DUT of the testing circuit are multiplied by different LO frequencies signals at mixers stages, which different frequency-translated spectrums were captured at capture port simultaneously for achieving fully parallel test of RF device.
Keywords :
frequency synthesizers; integrated circuit testing; mixers (circuits); device under test; frequency synthesizer; frequency-translated spectrums; mixers stages; multisite testing; radiofrequency device; testing circuit; Band pass filters; Circuit testing; Costs; Electronic equipment testing; Frequency synthesizers; Performance evaluation; Power combiners; Radio frequency; Signal design; Signal generators;
Conference_Titel :
Test Conference, 2009. ITC 2009. International
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4244-4868-5
Electronic_ISBN :
978-1-4244-4867-8
DOI :
10.1109/TEST.2009.5355814
