DocumentCode :
2707337
Title :
VLSI circuit challenges for integrated sensing systems
Author :
Wise, K.D.
fYear :
1990
fDate :
7-9 June 1990
Firstpage :
10
Lastpage :
22
Abstract :
The challenges facing the development of monolithic instrumentation systems are reviewed. Sensor technology is discussed, and examples of merging transducer and circuit processes are given. It is noted that, for many future systems, transducers, analog circuits, logic, and memory should probably be merged on a single chip, and system-level standards are needed to focus such efforts. It is concluded that microcomputer-based sensing nodes capable of functioning as smart peripherals and employing features such as self-testing, autocalibration, and PROM-based digital compensation should be realizable on a single chip within a decade
Keywords :
VLSI; application specific integrated circuits; digital signal processing chips; electric sensing devices; error compensation; integrated circuit technology; signal processing equipment; transducers; PROM-based digital compensation; VLSI circuit challenges; autocalibration; features; integrated sensing systems; merging transducer and circuit processes; microcomputer-based sensing nodes; mixed-mode ASICs; monolithic instrumentation systems; on-chip transducers; self-testing; sensor technology; signal conditioning circuits; single chip; smart peripherals;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Circuits, 1990. Digest of Technical Papers., 1990 Symposium on
Conference_Location :
Honolulu, Hawaii, USA
Type :
conf
DOI :
10.1109/VLSIC.1990.111130
Filename :
5727562
Link To Document :
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