Title :
How (Un)affordable is the true cost of test?
Author_Institution :
Sun Microsytems, Inc., Sunnyvale, CA, USA
Abstract :
In this panel we will examine the cost of test from the perspective of several companies with different markets and requirements. What are the important factors for them and for their customers? How do they calculate the cost of test, and how do they compute the benefits? How are decisions on test features and test strategies made? We will be discussing numbers, but also, more importantly, how the numbers are used to contribute to product success.
Keywords :
electronics industry; testing; test requirements; test strategies; testing benefits; testing costs; Availability; Costs; Design for testability; Electronic equipment testing; Engineering management; Job design; Semiconductor device measurement; Sun; System testing;
Conference_Titel :
Test Conference, 2009. ITC 2009. International
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4244-4868-5
Electronic_ISBN :
978-1-4244-4867-8
DOI :
10.1109/TEST.2009.5355816
