DocumentCode
2707340
Title
How (Un)affordable is the true cost of test?
Author
Davidson, Scott
Author_Institution
Sun Microsytems, Inc., Sunnyvale, CA, USA
fYear
2009
fDate
1-6 Nov. 2009
Firstpage
1
Lastpage
1
Abstract
In this panel we will examine the cost of test from the perspective of several companies with different markets and requirements. What are the important factors for them and for their customers? How do they calculate the cost of test, and how do they compute the benefits? How are decisions on test features and test strategies made? We will be discussing numbers, but also, more importantly, how the numbers are used to contribute to product success.
Keywords
electronics industry; testing; test requirements; test strategies; testing benefits; testing costs; Availability; Costs; Design for testability; Electronic equipment testing; Engineering management; Job design; Semiconductor device measurement; Sun; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2009. ITC 2009. International
Conference_Location
Austin, TX
Print_ISBN
978-1-4244-4868-5
Electronic_ISBN
978-1-4244-4867-8
Type
conf
DOI
10.1109/TEST.2009.5355816
Filename
5355816
Link To Document