Title :
Noniinear Refractive Index Measurement By Z-scan Technique In Amorphous As2s, Thin Film
Author :
Lee, Yeung Lak ; Kim, Seong Gyu ; Kwak, Chong Hoon ; Choe, Ok Shik
Author_Institution :
Yeungnam University, Korea
Keywords :
Amorphous materials; Apertures; Atomic measurements; Diffraction; Gold; Optical control; Physics; Refractive index; Transistors; Uncertainty;
Conference_Titel :
Lasers and Electro-Optics, 1997. CLEO/Pacific Rim '97., Pacific Rim Conference on
Conference_Location :
Chiba, Japan
Print_ISBN :
0-7803-3889-8
DOI :
10.1109/CLEOPR.1997.610711
