Noniinear Refractive Index Measurement By Z-scan Technique In Amorphous As2s, Thin Film

Author

Lee, Yeung Lak ; Kim, Seong Gyu ; Kwak, Chong Hoon ; Choe, Ok Shik

Author_Institution

Yeungnam University, Korea

fYear

1997

fDate

14-18 July 1997

Firstpage

176

Lastpage

177

Keywords

Amorphous materials; Apertures; Atomic measurements; Diffraction; Gold; Optical control; Physics; Refractive index; Transistors; Uncertainty;

fLanguage

English

Publisher

ieee

Conference_Titel

Lasers and Electro-Optics, 1997. CLEO/Pacific Rim '97., Pacific Rim Conference on

Conference_Location

Chiba, Japan

Print_ISBN

0-7803-3889-8

Type

DOI

10.1109/CLEOPR.1997.610711

Filename

610711

Link To Document