Title :
A 3-bit 20GS/s interleaved flash analog-to-digital converter in SiGe technology
Author :
Yao, Yuan ; Yu, Xuefeng ; Yang, Dayu ; Dai, Foster ; Irwin, J. David ; Jaeger, Richard C.
Author_Institution :
Auburn Univ., Auburn
Abstract :
A 3-bit analog-to-digital converter (ADC) for software defined radio applications that can work at a sampling rate of 20 GS/s is presented in this paper. In order to operate at Ku-band, two flash current mode logic (CML) ADCs are time-interleaved to achieve a 20 GHz sampling rate. A 3-bit current-steering digital-to-analog converter (DAC) is also designed for testing the high-speed ADC. The ADC-DAC RFIC is implemented in a 0.12 mum SiGe technology and occupies an area of 1.5 times 1.7 mm2. The total power consumption for the entire ADC-DAC chip is 2.36 W with a 4.2 V power supply. The ADC-DAC RFIC is packaged in a 44-pin CLLC package and achieves a peak spurious free dynamic range (SFDR) of 30.5 dBc and a peak effective number of bits (ENOB) of 2.8 bits at a 20 GS/s sampling rate.
Keywords :
Ge-Si alloys; analogue-digital conversion; digital-analogue conversion; software radio; 3-bit current-steering digital-to-analog converter; ADC-DAC RFIC; Ku-band; SiGe; flash current mode logic ADC; frequency 20 GHz; interleaved flash analog-to-digital converter; peak spurious free dynamic range; power 2.36 W; software defined radio applications; time interleaving; voltage 4.2 V; word length 3 bit; Analog-digital conversion; Application software; Digital-analog conversion; Germanium silicon alloys; Logic; Packaging; Radiofrequency integrated circuits; Sampling methods; Silicon germanium; Software radio;
Conference_Titel :
Solid-State Circuits Conference, 2007. ASSCC '07. IEEE Asian
Conference_Location :
Jeju
Print_ISBN :
978-1-4244-1359-1
Electronic_ISBN :
978-1-4244-1360-7
DOI :
10.1109/ASSCC.2007.4425720