DocumentCode :
2707599
Title :
Defect coverage of non-intrusive board tests (NBT): What does it mean when a non-intrusive board test passes?
Author :
Ley, Adam W.
Author_Institution :
ASSET InterTech, Inc., Richardson, TX, USA
fYear :
2009
fDate :
1-6 Nov. 2009
Firstpage :
1
Lastpage :
1
Abstract :
Non-intrusive board test (NBT) is an emerging test methodology that integrates several complementary test technologies to restore test coverage lost due to diminishing physical (probe) access to printed circuit boards. While NBT boundary-scan test provides a core capability for structural test (e.g., shorts & opens), NBT processor-controlled test adds an element of functional test (e.g., at-speed operation) and NBT built-in self test delivers performance test (e.g., on-margin operation). A framework to consider the overall test coverage in these multiple dimensions is required to assess the full impact of the test strategy.
Keywords :
built-in self test; printed circuit testing; NBT boundary-scan test; NBT built-in self test; NBT processor-controlled test; nonintrusive board tests; printed circuit boards; Automatic testing; Chip scale packaging; Cost function; Design optimization; Instruments; Life testing; Manufacturing; Production; Profitability; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 2009. ITC 2009. International
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4244-4868-5
Electronic_ISBN :
978-1-4244-4867-8
Type :
conf
DOI :
10.1109/TEST.2009.5355828
Filename :
5355828
Link To Document :
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