• DocumentCode
    2707599
  • Title

    Defect coverage of non-intrusive board tests (NBT): What does it mean when a non-intrusive board test passes?

  • Author

    Ley, Adam W.

  • Author_Institution
    ASSET InterTech, Inc., Richardson, TX, USA
  • fYear
    2009
  • fDate
    1-6 Nov. 2009
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    Non-intrusive board test (NBT) is an emerging test methodology that integrates several complementary test technologies to restore test coverage lost due to diminishing physical (probe) access to printed circuit boards. While NBT boundary-scan test provides a core capability for structural test (e.g., shorts & opens), NBT processor-controlled test adds an element of functional test (e.g., at-speed operation) and NBT built-in self test delivers performance test (e.g., on-margin operation). A framework to consider the overall test coverage in these multiple dimensions is required to assess the full impact of the test strategy.
  • Keywords
    built-in self test; printed circuit testing; NBT boundary-scan test; NBT built-in self test; NBT processor-controlled test; nonintrusive board tests; printed circuit boards; Automatic testing; Chip scale packaging; Cost function; Design optimization; Instruments; Life testing; Manufacturing; Production; Profitability; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2009. ITC 2009. International
  • Conference_Location
    Austin, TX
  • Print_ISBN
    978-1-4244-4868-5
  • Electronic_ISBN
    978-1-4244-4867-8
  • Type

    conf

  • DOI
    10.1109/TEST.2009.5355828
  • Filename
    5355828