DocumentCode
2707599
Title
Defect coverage of non-intrusive board tests (NBT): What does it mean when a non-intrusive board test passes?
Author
Ley, Adam W.
Author_Institution
ASSET InterTech, Inc., Richardson, TX, USA
fYear
2009
fDate
1-6 Nov. 2009
Firstpage
1
Lastpage
1
Abstract
Non-intrusive board test (NBT) is an emerging test methodology that integrates several complementary test technologies to restore test coverage lost due to diminishing physical (probe) access to printed circuit boards. While NBT boundary-scan test provides a core capability for structural test (e.g., shorts & opens), NBT processor-controlled test adds an element of functional test (e.g., at-speed operation) and NBT built-in self test delivers performance test (e.g., on-margin operation). A framework to consider the overall test coverage in these multiple dimensions is required to assess the full impact of the test strategy.
Keywords
built-in self test; printed circuit testing; NBT boundary-scan test; NBT built-in self test; NBT processor-controlled test; nonintrusive board tests; printed circuit boards; Automatic testing; Chip scale packaging; Cost function; Design optimization; Instruments; Life testing; Manufacturing; Production; Profitability; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2009. ITC 2009. International
Conference_Location
Austin, TX
Print_ISBN
978-1-4244-4868-5
Electronic_ISBN
978-1-4244-4867-8
Type
conf
DOI
10.1109/TEST.2009.5355828
Filename
5355828
Link To Document