Title :
Manufacturing data: Maximizing value using component-to-system analysis
Author_Institution :
Cisco Systems, Inc, USA
Abstract :
This poster will provide a high-level description of Cisco´s manufacturing process including how, where and in what form data is collected at various test steps. Trade offs are described to optimize test time and diagnostics for any failing parts in order to provide actionable data for failure analysis. The principal goal of the poster is to raise awareness regarding base component requirements for embedded instrumentation to allow for optimal diagnostic results and speed. Also how synchronized data sharing with stake holders can optimize closed loop corrective action, resources and quality.
Keywords :
design for testability; equipment evaluation; failure analysis; optimisation; base component requirements; closed loop corrective action; component-to-system analysis; data collection; diagnostics; embedded instrumentation; failure analysis; manufacturing process; optimization; quality; synchronized data sharing; test time; Circuit noise; Computer errors; Debugging; Error analysis; Integrated circuit interconnections; Logic; Manufacturing; Power supplies; Signal design; Signal processing;
Conference_Titel :
Test Conference, 2009. ITC 2009. International
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4244-4868-5
Electronic_ISBN :
978-1-4244-4867-8
DOI :
10.1109/TEST.2009.5355834
