Manufacturing data: Maximizing value using component-to-system analysis

Author

Kamm, Matthias

Author_Institution

Cisco Systems, Inc, USA

fYear

2009

fDate

1-6 Nov. 2009

Firstpage

1

Lastpage

1

Abstract

This poster will provide a high-level description of Cisco´s manufacturing process including how, where and in what form data is collected at various test steps. Trade offs are described to optimize test time and diagnostics for any failing parts in order to provide actionable data for failure analysis. The principal goal of the poster is to raise awareness regarding base component requirements for embedded instrumentation to allow for optimal diagnostic results and speed. Also how synchronized data sharing with stake holders can optimize closed loop corrective action, resources and quality.

Keywords

design for testability; equipment evaluation; failure analysis; optimisation; base component requirements; closed loop corrective action; component-to-system analysis; data collection; diagnostics; embedded instrumentation; failure analysis; manufacturing process; optimization; quality; synchronized data sharing; test time; Circuit noise; Computer errors; Debugging; Error analysis; Integrated circuit interconnections; Logic; Manufacturing; Power supplies; Signal design; Signal processing;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 2009. ITC 2009. International

Conference_Location

Austin, TX

Print_ISBN

978-1-4244-4868-5

Electronic_ISBN

978-1-4244-4867-8

Type

conf

DOI

10.1109/TEST.2009.5355834

Filename

5355834