Title :
Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476)
Abstract :
Presents the front cover and table of contents to the Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476).
Keywords :
BiCMOS integrated circuits; CMOS integrated circuits; electrostatic discharge; magnetic recording; standards; BiCMOS; CMOS; circuits; factory issues; magnetic recording; materials; standards; systems;
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000
Conference_Location :
Anaheim, CA, USA
Print_ISBN :
1-58537-018-5
DOI :
10.1109/EOSESD.2000.890020
