• DocumentCode
    2707844
  • Title

    Detecting ESD events using a loop antenna

  • Author

    Muñoz, Jesus L. ; Tan, Jonah ; Adriano, Carlito ; Roldan, Erwin ; Sadie, Jack

  • Author_Institution
    Intel Technol. Philippines Inc., Cavite, Philippines
  • fYear
    2000
  • fDate
    26-28 Sept. 2000
  • Firstpage
    60
  • Lastpage
    64
  • Abstract
    Electrostatic discharge (ESD) is the rapid transfer of electrostatic charge between bodies at different electrostatic potentials. In an ESD event, a short burst of radiated energy in the form of an electromagnetic pulse or electromagnetic interference (EMI) is created. In this paper, we discuss the use of a homemade loop to detect the EMI generated by an ESD event. We also report the observed correlation between three industry defined ESD stress models and the radiated EMI signal as detected by the loop antenna. A Zapmaster Keytek 512 zapper is used to simulate the ESD events and a high-speed oscilloscope is used to capture the EMI detected by the loop antenna. In the paper, we also report use of the loop antenna in solving an ESD issue that affected the 32M Boot Block flash memory device.
  • Keywords
    electric variables measurement; electromagnetic interference; electromagnetic pulse; electrostatic discharge; flash memories; integrated memory circuits; loop antennas; oscilloscopes; 32 Mbit; Boot Block flash memory device; EMI; EMI capture; EMI detection; ESD; ESD event; ESD event detection; ESD event simulation; ESD stress models; Zapmaster Keytek 512 zapper; electromagnetic interference; electromagnetic pulse; electrostatic charge transfer; electrostatic discharge; electrostatic potentials; high-speed oscilloscope; loop antenna; radiated EMI signal; radiated energy; Discrete event simulation; EMP radiation effects; Electromagnetic interference; Electrostatic discharge; Electrostatic interference; Event detection; Flash memory; Oscilloscopes; Signal detection; Stress;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000
  • Conference_Location
    Anaheim, CA, USA
  • Print_ISBN
    1-58537-018-5
  • Type

    conf

  • DOI
    10.1109/EOSESD.2000.890028
  • Filename
    890028