• DocumentCode
    2707996
  • Title

    Computerized classification of malignant and benign clustered microcalcifications in mammograms

  • Author

    Jiang, Yulei ; Nishikawa, Robert M. ; Wolverton, Dulcy E. ; Metz, Charles E. ; Schmidt, Robert A. ; Doi, Kunio

  • Author_Institution
    Dept. of Radiol., Chicago Univ., IL, USA
  • Volume
    2
  • fYear
    1997
  • fDate
    30 Oct-2 Nov 1997
  • Firstpage
    521
  • Abstract
    The purpose of this study was to evaluate the performance of the authors´ computerized classification scheme for clustered microcalcifications using two independent databases. The computer scheme estimates the likelihood that a microcalcification cluster is malignant on the basis of eight computer-extracted image features using an artificial neural network. Two biopsy-proven microcalcification databases were used in the performance evaluation, one of which was a quasi-consecutive biopsy series. The classification performance of the computer scheme was compared to the performance of two groups of five radiologists. On both databases, the classification performance of the computer scheme was statistically significantly better than that of the radiologists. This study demonstrates the potential of the computer scheme in clinical applications
  • Keywords
    feature extraction; image classification; mammography; medical image processing; neural nets; artificial neural network; benign clustered microcalcifications; breast cancer; clinical applications; computer-extracted image features; computerized classification; independent databases; malignant clustered microcalcifications; mammograms; medical diagnostic imaging; quasiconsecutive biopsy series; Artificial neural networks; Biopsy; Cancer; Computer networks; Feature extraction; Image databases; Laboratories; Lesions; Spatial databases; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 1997. Proceedings of the 19th Annual International Conference of the IEEE
  • Conference_Location
    Chicago, IL
  • ISSN
    1094-687X
  • Print_ISBN
    0-7803-4262-3
  • Type

    conf

  • DOI
    10.1109/IEMBS.1997.757660
  • Filename
    757660