Title :
Optical and dielectric behaviour of polyethylene
Author :
Das-Gupta, Dilip K.
Author_Institution :
Sch. of Electron. Eng. & Comput. Syst., Univ. of Wales, Bangor, UK
Abstract :
The behaviour of the frequency dependent complex permittivity may provide useful information on the changes of electronic structure of the valence band, localized energy states in the forbidden gap and the insulation characteristics of polyethylene, and its aging with electrical stress. X-ray photo electron spectroscopy (XPS) and electron energy loss spectroscopy (ELS) at extremely high frequencies (E/h) can be used to determine the electronic structure of the valence band and the components of the complex permittivity. The results of the ELS are also equivalent to those of optical reflection and absorption at comparable wavelengths. Small Angle Light Scattering (SALS) study provides information on changes of morphology including changes in spherulite structure, with externally applied stress. Finally the usefulness of dielectric spectroscopy in the frequency range of 10 -5 Hz to 105 Hz has been discussed for an evaluation of the electrical aging of polyethylene
Keywords :
X-ray photoelectron spectra; X-ray spectroscopy; ageing; dielectric losses; dielectric materials; dielectric measurement; electron energy loss spectra; electron spectroscopy; light scattering; localised states; permittivity; polyethylene insulation; polymers; valence bands; X-ray photoelectron spectroscopy; aging; dielectric spectroscopy; electrical stress; electron energy loss spectroscopy; electronic structure; forbidden gap; frequency dependent complex permittivity; insulation characteristics; localized energy states; morphology changes; polyethylene; small angle light scattering; spherulite structure; valence band; Aging; Dielectrics; Electron optics; Energy states; Frequency dependence; Optical scattering; Permittivity; Polyethylene; Spectroscopy; Stress;
Conference_Titel :
Electrical Insulation, 1994., Conference Record of the 1994 IEEE International Symposium on
Conference_Location :
Pittsburgh, PA
Print_ISBN :
0-7803-1942-7
DOI :
10.1109/ELINSL.1994.401480
