• DocumentCode
    2708350
  • Title

    A Robust RF MEMS Variable Capacitor with Piezoelectric and Electrostatic Actuation

  • Author

    Ikehashi, T. ; Ohguro, T. ; Ogawa, E. ; Yamazaki, H. ; Kojima, K. ; Matsuo, M. ; Ishimaru, K. ; Ishiuchi, H.

  • Author_Institution
    Toshiba Corp., Semicond. Co., Yokohama
  • fYear
    2006
  • fDate
    11-16 June 2006
  • Firstpage
    39
  • Lastpage
    42
  • Abstract
    An RF MEMS variable capacitor using hybrid actuation of piezoelectric and electrostatic forces is presented. A surface micromachining process is used to fabricate the device. The piezoelectric actuator, which uses thin film PZT, enables low voltage actuation while the electrostatic actuator realizes large capacitance ratio. The measured capacitance ratio is Cmax/Cmin=14 at 5V. We demonstrate that the hybrid actuation enables to lower the pull-in voltage without changing the pull-out voltage. We also show that the shift of pull-out voltage due to dielectric charging can be reduced drastically at actuation voltages below 10V. In this sense, the hybrid actuation can realize low voltage operation with enhanced robustness for stiction
  • Keywords
    capacitors; electrostatic actuators; lead compounds; micromachining; piezoelectric actuators; surface treatment; thin film devices; zirconium compounds; 5 V; PZT; PbZrO3TiO3; RF MEMS variable capacitor; capacitance ratio; dielectric charging; electrostatic actuation; electrostatic actuator; electrostatic forces; low voltage actuation; piezoelectric actuation; piezoelectric actuator; piezoelectric forces; pull-out voltage; surface micromachining process; thin film PZT; Capacitance measurement; Capacitors; Dielectric measurements; Electrostatic actuators; Low voltage; Micromachining; Piezoelectric actuators; Piezoelectric films; Radiofrequency microelectromechanical systems; Robustness; RF MEMS; dielectric charging; piezoelectric actuator; stiction; surface micromachining; variable capacitor;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 2006. IEEE MTT-S International
  • Conference_Location
    San Francisco, CA
  • ISSN
    0149-645X
  • Print_ISBN
    0-7803-9541-7
  • Electronic_ISBN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.2006.249903
  • Filename
    4014812