ESD sensitivity of GMR heads at variable pulse length

Author

Guarisco, Davide ; Li, Monica Lin

Author_Institution

Maxtor Corp., Milpitas, CA, USA

fYear

2000

fDate

26-28 Sept. 2000

Firstpage

322

Lastpage

326

Abstract

9 Gb/in/sup 2/ GMR heads were subjected to electrical overstress using square pulses of variable duration. The pulse length was varied between 4 ns and 80 ms. For each pulse length, the magnetic and physical failure thresholds were measured via a quasi-static test. It is found that for long pulses (/spl gsim/1 /spl mu/s) the GMR sensors fail at constant power, whereas at very short times (<100 ns), the system starts to gradually transition to an adiabatic regime where failure occurs at constant energy.

Keywords

electronic equipment testing; electrostatic discharge; failure analysis; giant magnetoresistance; magnetic heads; magnetic sensors; magnetoresistive devices; 1 mus; 100 ns; 4 ns to 80 ms; ESD sensitivity; GMR heads; GMR sensors; adiabatic regime transition; electrical overstress; failure; magnetic failure threshold; physical failure threshold; pulse duration; pulse length; quasi-static test; square pulses; variable pulse length; Biological system modeling; Electrostatic discharge; Magnetic heads; Pulse generation; Pulse measurements; Pulse shaping methods; Sensor phenomena and characterization; Shape; Stress measurement; Testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000

Conference_Location

Anaheim, CA, USA

Print_ISBN

1-58537-018-5

Type

conf

DOI

10.1109/EOSESD.2000.890092

Filename

890092