• DocumentCode
    2708413
  • Title

    Krylov Model Order Reduction of Finite Element Models of Electromagnetic Structures with Frequency-Dependent Material Properties

  • Author

    Wu, Hong ; Cangellaris, Andreas

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Illinois Univ. at Urbana-Champaign, Urbana, IL
  • fYear
    2006
  • fDate
    11-16 June 2006
  • Firstpage
    52
  • Lastpage
    55
  • Abstract
    Krylov subspace-based model order reduction (MOR) of finite element models of electromagnetic structures is not readily applicable when the electromagnetic properties of the materials exhibit arbitrary frequency dependence. This paper presents a methodology for overcoming this hurdle. The proposed Krylov MOR process is demonstrated through its application to the expedient broadband analysis of the impact of skin-effect loss on the transmission properties of a microstrip bandpass filter and the extraction of the propagation characteristics of a microstrip line on a dielectric substrate with frequency-dependent permittivity described by a Debye model
  • Keywords
    band-pass filters; dielectric materials; electromagnetic wave propagation; electromagnetic wave transmission; finite element analysis; microstrip filters; permittivity; reduced order systems; skin effect; Debye model; Krylov MOR process; Krylov model order reduction; dielectric substrate; electromagnetic structures; finite element models; frequency-dependent material properties; frequency-dependent permittivity; microstrip bandpass filter; microstrip line; propagation characteristics; skin-effect loss; transmission properties; Band pass filters; Dielectric losses; Dielectric substrates; Electromagnetic modeling; Finite element methods; Frequency dependence; Material properties; Microstrip filters; Permittivity; Propagation losses; Model order reduction; dispersive media; finite element method; frequency dependent rational function;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 2006. IEEE MTT-S International
  • Conference_Location
    San Francisco, CA
  • ISSN
    0149-645X
  • Print_ISBN
    0-7803-9541-7
  • Electronic_ISBN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.2006.249925
  • Filename
    4014816