DocumentCode
2708424
Title
A comparison of quasi-static characteristics and failure signatures of GMR heads subjected to CDM and HBM ESD events
Author
Moore, Chris
Author_Institution
Integral Solutions, San Jose, CA, USA
fYear
2000
fDate
26-28 Sept. 2000
Firstpage
343
Lastpage
348
Abstract
The effects of the human body model (HBM) electrostatic discharge (ESD) waveform on giant magnetoresistive (GMR) heads is fairly well characterized. This information provides a baseline against which a comparison can be made for other ESD models. The goal of this work is to compare and contrast the effects that are seen in GMR sensors when they are subjected to the charged-device model (CDM) versus HBM ESD events. This study compares the effects of CDM waveforms versus HBM waveforms on a single design of MR head. Although the HBM waveform has provided a starting point for understanding ESD damage to GMR heads, it is believed that the CDM model has a more useful basis in the reality of head manufacturing. This makes study of the effects of CDM ESD events on GMR heads both important and interesting. Detailed characterization of head response as a function of the ESD waveform was realized using a new system combining quasi-static (QST) analysis with in-situ CDM and HBM ESD simulation capabilities. A SEM was used to perform failure analysis on damaged heads in an attempt to characterize differences in the "failure signature" of the sensor.
Keywords
electronic equipment manufacture; electronic equipment testing; electrostatic discharge; failure analysis; giant magnetoresistance; magnetic heads; magnetic sensors; magnetoresistive devices; scanning electron microscopy; CDM ESD events; CDM model; CDM waveforms; ESD damage; ESD models; ESD waveform; GMR heads; GMR sensors; HBM ESD events; HBM waveforms; MR head design; SEM; charged-device model; damaged heads; electrostatic discharge; failure analysis; failure signature; failure signatures; giant magnetoresistive heads; head manufacturing; head response; human body model; in-situ CDM ESD simulation; in-situ HBM ESD simulation; quasi-static analysis; quasi-static characteristics; Analytical models; Biological system modeling; Electrostatic discharge; Failure analysis; Giant magnetoresistance; Humans; Magnetic heads; Magnetic sensors; Sensor phenomena and characterization; Virtual manufacturing;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000
Conference_Location
Anaheim, CA, USA
Print_ISBN
1-58537-018-5
Type
conf
DOI
10.1109/EOSESD.2000.890098
Filename
890098
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