• DocumentCode
    2708424
  • Title

    A comparison of quasi-static characteristics and failure signatures of GMR heads subjected to CDM and HBM ESD events

  • Author

    Moore, Chris

  • Author_Institution
    Integral Solutions, San Jose, CA, USA
  • fYear
    2000
  • fDate
    26-28 Sept. 2000
  • Firstpage
    343
  • Lastpage
    348
  • Abstract
    The effects of the human body model (HBM) electrostatic discharge (ESD) waveform on giant magnetoresistive (GMR) heads is fairly well characterized. This information provides a baseline against which a comparison can be made for other ESD models. The goal of this work is to compare and contrast the effects that are seen in GMR sensors when they are subjected to the charged-device model (CDM) versus HBM ESD events. This study compares the effects of CDM waveforms versus HBM waveforms on a single design of MR head. Although the HBM waveform has provided a starting point for understanding ESD damage to GMR heads, it is believed that the CDM model has a more useful basis in the reality of head manufacturing. This makes study of the effects of CDM ESD events on GMR heads both important and interesting. Detailed characterization of head response as a function of the ESD waveform was realized using a new system combining quasi-static (QST) analysis with in-situ CDM and HBM ESD simulation capabilities. A SEM was used to perform failure analysis on damaged heads in an attempt to characterize differences in the "failure signature" of the sensor.
  • Keywords
    electronic equipment manufacture; electronic equipment testing; electrostatic discharge; failure analysis; giant magnetoresistance; magnetic heads; magnetic sensors; magnetoresistive devices; scanning electron microscopy; CDM ESD events; CDM model; CDM waveforms; ESD damage; ESD models; ESD waveform; GMR heads; GMR sensors; HBM ESD events; HBM waveforms; MR head design; SEM; charged-device model; damaged heads; electrostatic discharge; failure analysis; failure signature; failure signatures; giant magnetoresistive heads; head manufacturing; head response; human body model; in-situ CDM ESD simulation; in-situ HBM ESD simulation; quasi-static analysis; quasi-static characteristics; Analytical models; Biological system modeling; Electrostatic discharge; Failure analysis; Giant magnetoresistance; Humans; Magnetic heads; Magnetic sensors; Sensor phenomena and characterization; Virtual manufacturing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000
  • Conference_Location
    Anaheim, CA, USA
  • Print_ISBN
    1-58537-018-5
  • Type

    conf

  • DOI
    10.1109/EOSESD.2000.890098
  • Filename
    890098